Publications

Modeling and direct extraction of band offset induced by stress engineering in silicon-on-insulator metal-oxide-semiconductor field effect transistors: Implications for device reliability

Fri, 06/06/2014 - 15:53 webadm

Journal of Applied Physics, vol. 105. 2009.

Fri, 06/06/2014 - 15:52 webadm

Astrophysical Journal, vol. 705. pp. 68-88, 2009.

Fri, 06/06/2014 - 15:54 webadm

Astronomical Journal, vol. 138. pp. 146-158, 2009.

Fri, 06/06/2014 - 15:53 webadm

Astrophysical Journal, vol. 706. pp. 727-737, 2009.

Fri, 06/06/2014 - 15:52 webadm

Low Temperature Detectors Ltd 13, vol. 1185. pp. 751-754, 2009.

Fri, 06/06/2014 - 15:52 webadm

Cosmic Dust - Near and Far, vol. 414. p. 473, 2009.

Fri, 06/06/2014 - 15:53 webadm

Monthly Notices of the Royal Astronomical Society, vol. 395. pp. L16-L20, 2009.

Fri, 06/06/2014 - 15:53 webadm

Astronomy & Astrophysics, vol. 506. pp. 797-798, 2009.

Fri, 06/06/2014 - 15:52 webadm

Ieee Transactions on Applied Superconductivity, vol. 19. pp. 481-483, 2009.

Fri, 06/06/2014 - 15:53 webadm

Optical Materials, vol. 31. pp. 1393-1397, 2009.