The technical challenges of the Solar-Orbiter EUI instrument
|Title||The technical challenges of the Solar-Orbiter EUI instrument|
|Publication Type||Conference Paper|
|Year of Publication||2010|
|Authors||Halain, J-P, Rochus, P, Appourchaux, T, Berghmans, D, Harra, L, Schühle, U, Auchère, F, Zhukov, A, Renotte, E, Defise, J-M, Rossi, L, Fleury-Frenette, K, Jacques, L, Hochedez, J-F, Ben Moussa, A|
|Conference Name||Society of Photo-Optical Instrumentation Engineers (SPIE) Conference Series|
|Date Published||July 1, 2010|
The Extreme Ultraviolet Imager (EUI) onboard Solar Orbiter consists of a suite of two high-resolution imagers (HRI) and one dual-band full Sun imager (FSI) that will provide EUV and Lyman-α images of the solar atmospheric layers above the photosphere. The EUI instrument is based on a set of challenging new technologies allowing to reach the scientific objectives and to cope with the hard space environment of the Solar Orbiter mission. The mechanical concept of the EUI instrument is based on a common structure supporting the HRI and FSI channels, and a separated electronic box. A heat rejection baffle system is used to reduce the Sun heat load and provide a first protection level against the solar disk straylight. The spectral bands are selected by thin filters and multilayer mirror coatings. The detectors are 10μm pitch back illuminated CMOS Active Pixel Sensors (APS), best suited for the EUI science requirements and radiation hardness. This paper presents the EUI instrument concept and its major sub-systems. The current developments of the instrument technologies are also summarized.