Metrology for an imaging Fourier transform spectrometer working in the far-UV (IFTSUV)
|Titre||Metrology for an imaging Fourier transform spectrometer working in the far-UV (IFTSUV)|
|Type de publication||Conference Paper|
|Year of Publication||2011|
|Auteurs||C. Fanjul, Rde Galarre, Philippon, A, Vial, J-C, Maillard, J-P, Appourchaux, T|
|Conference Name||Society of Photo-Optical Instrumentation Engineers (SPIE) Conference Series|
|Date Published||September 1, 2011|
Imaging Fourier Transform Spectrometer working in the far UV (IFTSUV) may be the technical solution to answer many unsolved problems concerning the physics of the solar outer atmosphere. The VUV domain highly constrains the instruments design and performances as it demands a high optics surface quality and an accurate metrology to preserve IFTSUV spectral precision and Signal to Noise Ratio (SNR). We present the advancements on the specification of a metrology system, meeting the predicted performance requirements of an IFTSUV.