Characterization of NbSi films for TES bolometers
| Titre | Characterization of NbSi films for TES bolometers |
| Type de publication | Conference Paper |
| Year of Publication | 2008 |
| Auteurs | Atik, Y, Pajot, F, Evesque, C, Leriche, B, Bélier, B, Dumoulin, L, Bergé, L, Piat, M, Bréelle, E, Prele, D, Voisin, F |
| Conference Name | Society of Photo-Optical Instrumentation Engineers (SPIE) Conference Series |
| Date Published | August 1, 2008 |
| Résumé | Future space experiments will require large arrays of sensitive detectors in the submillimeter and millimeter range. Superconducting transition-edge sensors (TESs) are currently under heavy development to be used as ultra sensitive bolometers. In addition to good performance, the choice of material depends on long term stability (both physical and chemical) along with a good reproducibility and uniformity in fabrication. For this purpose we are investigating the properties of co-evaporated NbSi thin films. NbSi is a well-known alloy for use in resistive thermometers. We present a full low temperature characterization of superconductive NbSi films. In order to tune the critical temperature of the NbSi thermometers down to the desired range, we have to adjust the concentration of niobium in the NbSi alloy. Tests are made using 4He-cooled cryostats, 300mK 3He mini-fridges, Resistance Bridges and commercial SQUID. Measured parameters are the critical temperature, the sharpness of the transition. Noise measurements are on-going. |
